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authorSwati Sharma <swati2.sharma@intel.com>2022-06-30 13:15:10 +0300
committerJuha-Pekka Heikkila <juhapekka.heikkila@gmail.com>2022-07-01 12:41:09 +0300
commit6f242a33955e948d4ea256ec111d214ee8331b7f (patch)
tree4d391f9c9829e1bf639ab2bedb4a02e02773711d /lib/igt_kms.c
parent3cf110f8dcd1f4f02cf84339664b413abdaebf7d (diff)
tests/i915/kms_flip_scaled_crc: Convert tests to dynamic
Convert the existing subtests to dynamic subtests at pipe/output level. v2: Refactored code in such a manner that once test has been run successfully on chosen pipe that pipe will not be tested again as this test is testing pipe feature. No need to run separately for each connector using all pipes. v3: Changed seq to avoid modetoset as a dangling ptr v4: On eDP 1080p with 144Hz vrefresh, test fails with cdclk lim, however it passes with 90Hz vrefresh. Added the check to handle this scenario. v5: Minor fixes Cc: Juha-Pekka Heikkila <juhapekka.heikkila@gmail.com> Cc: Petri Latvala <petri.latvala@intel.com> Signed-off-by: Swati Sharma <swati2.sharma@intel.com> Acked-by: Petri Latvala <petri.latvala@intel.com> Reviewed-by: Juha-Pekka Heikkila <juhapekka.heikkila@gmail.com>
Diffstat (limited to 'lib/igt_kms.c')
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