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author | Swati Sharma <swati2.sharma@intel.com> | 2022-06-30 13:15:10 +0300 |
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committer | Juha-Pekka Heikkila <juhapekka.heikkila@gmail.com> | 2022-07-01 12:41:09 +0300 |
commit | 6f242a33955e948d4ea256ec111d214ee8331b7f (patch) | |
tree | 4d391f9c9829e1bf639ab2bedb4a02e02773711d /tests/device_reset.c | |
parent | 3cf110f8dcd1f4f02cf84339664b413abdaebf7d (diff) |
tests/i915/kms_flip_scaled_crc: Convert tests to dynamic
Convert the existing subtests to dynamic subtests at pipe/output level.
v2: Refactored code in such a manner that once test has been run
successfully on chosen pipe that pipe will not be tested again
as this test is testing pipe feature. No need to run separately
for each connector using all pipes.
v3: Changed seq to avoid modetoset as a dangling ptr
v4: On eDP 1080p with 144Hz vrefresh, test fails with cdclk
lim, however it passes with 90Hz vrefresh. Added the check
to handle this scenario.
v5: Minor fixes
Cc: Juha-Pekka Heikkila <juhapekka.heikkila@gmail.com>
Cc: Petri Latvala <petri.latvala@intel.com>
Signed-off-by: Swati Sharma <swati2.sharma@intel.com>
Acked-by: Petri Latvala <petri.latvala@intel.com>
Reviewed-by: Juha-Pekka Heikkila <juhapekka.heikkila@gmail.com>
Diffstat (limited to 'tests/device_reset.c')
0 files changed, 0 insertions, 0 deletions