diff options
| -rw-r--r-- | drivers/staging/iio/Documentation/sysfs-bus-iio | 19 |
1 files changed, 19 insertions, 0 deletions
diff --git a/drivers/staging/iio/Documentation/sysfs-bus-iio b/drivers/staging/iio/Documentation/sysfs-bus-iio index f7bc59a57a7..fb6c3812016 100644 --- a/drivers/staging/iio/Documentation/sysfs-bus-iio +++ b/drivers/staging/iio/Documentation/sysfs-bus-iio @@ -92,6 +92,24 @@ Description: is required is a consistent labeling. Units after application of scale and offset are microvolts. +What: /sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw +KernelVersion: 3.2 +Contact: linux-iio@vger.kernel.org +Description: + Raw capacitance measurement from channel Y. Units after + application of scale and offset are nanofarads. + +What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw +KernelVersion: 3.2 +Contact: linux-iio@vger.kernel.org +Description: + Raw differential capacitance measurement equivalent to + channel Y - channel Z where these channel numbers apply to the + physically equivalent inputs when non differential readings are + separately available. In differential only parts, then all that + is required is a consistent labeling. Units after application + of scale and offset are nanofarads.. + What: /sys/bus/iio/devices/iio:deviceX/in_temp_raw What: /sys/bus/iio/devices/iio:deviceX/in_tempX_raw What: /sys/bus/iio/devices/iio:deviceX/in_temp_x_raw @@ -251,6 +269,7 @@ What: /sys/bus/iio/devices/iio:deviceX/in_accel_scale_available What: /sys/.../iio:deviceX/in_voltageX_scale_available What: /sys/.../iio:deviceX/in_voltage-voltage_scale_available What: /sys/.../iio:deviceX/out_voltageX_scale_available +What: /sys/.../iio:deviceX/in_capacitance_scale_available KernelVersion: 2.635 Contact: linux-iio@vger.kernel.org Description: |