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Diffstat (limited to 'include/asm-sparc64/estate.h')
-rw-r--r--include/asm-sparc64/estate.h50
1 files changed, 1 insertions, 49 deletions
diff --git a/include/asm-sparc64/estate.h b/include/asm-sparc64/estate.h
index 520c08560d1..bedd0ef5f19 100644
--- a/include/asm-sparc64/estate.h
+++ b/include/asm-sparc64/estate.h
@@ -1,49 +1 @@
-#ifndef _SPARC64_ESTATE_H
-#define _SPARC64_ESTATE_H
-
-/* UltraSPARC-III E-cache Error Enable */
-#define ESTATE_ERROR_FMT 0x0000000000040000 /* Force MTAG ECC */
-#define ESTATE_ERROR_FMESS 0x000000000003c000 /* Forced MTAG ECC val */
-#define ESTATE_ERROR_FMD 0x0000000000002000 /* Force DATA ECC */
-#define ESTATE_ERROR_FDECC 0x0000000000001ff0 /* Forced DATA ECC val */
-#define ESTATE_ERROR_UCEEN 0x0000000000000008 /* See below */
-#define ESTATE_ERROR_NCEEN 0x0000000000000002 /* See below */
-#define ESTATE_ERROR_CEEN 0x0000000000000001 /* See below */
-
-/* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache
- * errors 2) uncorrectable E-cache errors. Such events only occur on reads
- * of the E-cache by the local processor for: 1) data loads 2) instruction
- * fetches 3) atomic operations. Such events _cannot_ occur for: 1) merge
- * 2) writeback 2) copyout. The AFSR bits associated with these traps are
- * UCC and UCU.
- */
-
-/* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps
- * for uncorrectable ECC errors and system errors.
- *
- * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT,
- * or system bus BusERR:
- * 1) As the result of an instruction fetch, will generate instruction_access_error
- * 2) As the result of a load etc. will generate data_access_error.
- * 3) As the result of store merge completion, writeback, or copyout will
- * generate a disrupting ECC_error trap.
- * 4) As the result of such errors on instruction vector fetch can generate any
- * of the 3 trap types.
- *
- * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE,
- * BERR, and TO.
- */
-
-/* CEEN enables the ECC_error trap for hardware corrected ECC errors. System bus
- * reads resulting in a hardware corrected data or MTAG ECC error will generate an
- * ECC_error disrupting trap with this bit enabled.
- *
- * This same trap will also be generated when a hardware corrected ECC error results
- * during store merge, writeback, and copyout operations.
- */
-
-/* In general, if the trap enable bits above are disabled the AFSR bits will still
- * log the events even though the trap will not be generated by the processor.
- */
-
-#endif /* _SPARC64_ESTATE_H */
+#include <asm-sparc/estate.h>