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authorTim Gore <tim.gore@intel.com>2015-03-03 10:43:43 +0000
committerDaniel Vetter <daniel.vetter@ffwll.ch>2015-03-04 16:18:13 +0100
commitee5c119c0cfe990ada07ae47a22f4d7f05b415d5 (patch)
treeb464fb72abb5e51be95c48c55296a33f2636389e /NEWS
parent9f90aabc66cd62b328c16e6917dc76baafd3ab5e (diff)
tests/gem_render_tiled_blits: split into subtests
The gem_render_tiled_blits test tends to get oom killed on low memory (< 4GB) Android systems. This is because the test tries to allocate (sysinfo.totalram * 9 / 10) in buffer objects and the remaining 10% of memory is not always enough for the Android system. A similar issue with gem_render_linear_blits was resolved by creating several subtests. A "basic" subtest that uses minimal memory buffers to test the basic operation, and two stress tests which are skipped if there is insufficient memory. The first stress test uses more memory than the graphics apperture and the second uses enough to ensure that swap space is used (if present). This patch makes the same changes to gem_render_tiled_blits. v2: Following comments from Daniel Vetter: a) Use igt_main macro instead of "open coding", and b) cull some leading spaces Signed-off-by: Tim Gore <tim.gore@intel.com>
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